超高压串补测量系统接触类故障深入性研究 *
祁宝才, 李永滨, 马顺绪, 李斌, 喻劲松, 答科超
In-depth Study on the Contact Fault of Ultra-high Voltage SC Measurement System
QI Baocai, LI Yongbin, MA Shunxu, LI Bin, YU Jinsong, DA Kechao
电气工程学报
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2020, (4): 106
-113
.
DOI: 10.11985/2020.04.013
