[1] |
CANTARELLA G, CARRESCIA V, TOMMASINI R. Quality of residual current-operated circuit breakers[J]. European Transactions on Electrical Power, 1996, 6(3):149-156.
doi: 10.1002/etep.v6:3
|
[2] |
杨凤彪. 漏电保护器可靠性技术的研究[D]. 天津: 河北工业大学, 2004.
|
|
YANG Fengbiao. Study on the reliability of residual current device[D]. Tianjin:Hebei University of Technology, 2004.
|
[3] |
LEE B H, KIM S H, KIM Y H. Reliability on the unintended trips of residual current operated circuit breakers due to surge currents[J]. Journal of the Korean Institute of Illuminating & Electrical Installation Engineers, 2012, 26(5):79-84.
|
[4] |
武一, 陆俭国, 迟长春. 漏电断路器的可靠性及其试验方法[J]. 电器与能效管理技术, 2008, 308(11):50-54.
|
|
WU Yi, LU Jianguo, CHI Changchun. Reliability of leakage circuit breaker and its test method[J]. Electrical and Energy Efficiency Management Technology, 2008, 308(11):50-54.
|
[5] |
武志刚. 漏电断路器可靠性及其失效机理分析[D]. 天津: 河北工业大学, 2012.
|
|
WU Zhigang. Reliability and failure mechanism analysis of leakage circuit breaker[D]. Tianjin:Hebei University of Technology, 2012.
|
[6] |
李宗芬, 朱旭明. 漏电断路器的拒动作与误动作的主要原因[J]. 建筑安全, 2009, 24(10):38-40.
|
|
LI Zongfen, ZHU Xuming. The main reasons for the refusal and malfunction of the leakage circuit breaker[J]. Building Safety, 2009, 24(10):38-40.
|
[7] |
林权胜. 漏电保护器的故障原因探析[J]. 大众科技, 2008(6):153-153.
|
|
LIN Quansheng. Analysis on the causes of the faults of the leakage protector[J]. Popular Science & Technology, 2008(6):153-153.
|
[8] |
李奎, 陆俭国, 武一, 等. 自适应漏电保护技术及其应用[J]. 电工技术学报, 2008, 23(10):53-57.
|
|
LI Kui, LU Jianguo, WU Yi, et al. Adaptive technology of leakage current operation protection and its application[J]. Transactions of China Electrotechnical Society, 2008, 23(10):53-57.
|
[9] |
叶鹏, 吴桂初, 赵升, 等. 剩余电流保护器的剩余动作电流温度特性研究[J]. 电器与能效管理技术, 2012, 398(5):12-15.
|
|
YE Peng, WU Guichu, ZHAO Sheng, et al. Research on temperature characteristics of residual operating current of residual current device[J]. Electrical and Energy Efficiency Management Technology, 2012, 398(5):12-15.
|
[10] |
刘帼巾, 边鑫磊, 马晓燕, 等. 基于数据融合的温度对漏电断路器动作特性的影响研究[J]. 测控技术, 2018, 37(4):41-45.
|
|
LIU Guojin, BIAN Xinlei, MA Xiaoyan, et al. Research on effect of temperature on operating characteristics of residual current circuit breaker based on data fusion technology[J]. Measurement & Control Technology, 2018, 37(4):41-45.
|
[11] |
韦海燕, 陈静, 王惠民, 等. 新陈代谢灰色粒子滤波实现电池剩余寿命预测[J]. 电工技术学报, 2020, 35(6):1181-1188.
|
|
WEI Haiyan, CHEN Jing, WANG Huimin, et al. Remaining useful life prediction of battery using metabolic grey particle filter[J]. Transactions of China Electrotechnical Society, 2020, 35(6):1181-1188.
|
[12] |
陈琳, 陈静, 王惠民, 等. 基于小波包能量熵的电池剩余寿命预测[J]. 电工技术学报, 2020, 35(8):1827-1835.
|
|
CHEN Lin, CHEN Jing, WANG Huimin, et al. Prediction of battery useful life based on wavelet packet energy entropy[J]. Transactions of China Electrotechnical Society, 2020, 35(8):1827-1835.
|
[13] |
孙曙光, 王锐雄, 杜太行, 等. 基于粗糙集与证据理论的交流接触器预期电寿命预测[J]. 电工技术学报, 2020, 35(10):2158-2169.
|
|
SUN Shuguang, WANG Ruixiong, DU Taihang, et al. Expected electrical life prediction of AC contactor based on rough set and evidence theory[J]. Transactions of China Electrotechnical Society, 2020, 35(10):2158-2169.
|
[14] |
高俊国, 孟睿潇, 胡海涛, 等. 电机定子绝缘老化寿命预测研究进展[J]. 电工技术学报, 2020, 35(14):3065-3074.
|
|
GAO Junguo, MENG Ruixiao, HU Haitao, et al. Research process on prediction of aging life of motor stator insulation[J]. Transactions of China Electrotechnical Society, 2020, 35(14):3065-3074.
|
[15] |
刘帼巾, 岳承浩, 李想. 漏电断路器的步进加速退化试验方案研究[J]. 电测与仪表, 2020, 57(14):129-134.
|
|
LIU Guojin, YUE Chenghao, LI Xiang. Research on step acceleration degradation test scheme of leakage circuit breaker[J]. Electrical Measurement & Instrumentation, 2020, 57(14):129-134.
|
[16] |
刘帼巾, 李想, 王泽, 等. 基于Wiener过程电子式漏电断路器的剩余寿命预测[J]. 电工技术学报, 2022, 37(2):528-536.
|
|
LIU Guojin, LI Xiang, WANG Ze, et al. Remaining life prediction of electronic residual current circuit breaker based on Wiener process[J]. Transactions of China Electrotechnical Society, 2022, 37(2):528-536.
|
[17] |
王晓剑, 徐喆, 徐俊元, 等. 一种电磁继电器寿命评估的新方法[J]. 电器与能效管理技术, 2018, 541(4):66-71.
|
|
WANG Xiaojian, XU Zhe, XU Junyuan, et al. A new life evaluation method of electromagnetic relay[J]. Electrical and Energy Efficiency Management Technology, 2018, 541(4):66-71.
|
[18] |
石颉, 袁晨翔, 孔维相, 等. 基于电-热加速老化的LED寿命评估检验方法研究[J]. 电子元件与材料, 2020, 39(8):89-95.
|
|
SHI Jie, YUAN Chenxiang, KONG Weixiang, et al. Research on the test method of LED life evaluation based on electro-thermal accelerated aging[J]. Electronic Components and Materials, 2020, 39(8):89-95.
|
[19] |
石颉, 孔维相, 袁晨翔, 等. 基于统计检验的光电耦合器寿命预测模型研究[J]. 电子元件与材料, 2020, 39(4):68-74,79.
|
|
SHI Jie, KONG Weixiang, YUAN Chenxiang, et al. Research on life prediction model of optocoupler based on normal test[J]. Electronic Components and Materials, 2020, 39(4):68-74,79.
|
[20] |
石颉. 基于统计检验的发电机定子线棒绝缘热老化寿命评估[J]. 绝缘材料, 2019, 52(12):7.
|
|
SHI Jie. Thermal ageing life evaluation of stator bar insulation for generator based on statistical test[J]. Insulation Materials, 2019, 52(12):7.
|
[21] |
LAKSHMINARAYANAN V, SRIRAAM N. The effect of temperature on the reliability of electronic components[C]// IEEE International Conference on Electronics,Computing and Communication Technologies,Bangalore,2014:1-6.
|
[22] |
雷芸, 邱云峰. 基于温度变化的电子元器件参数响应研究[J]. 计算机与数字工程, 2015, 43(1):155-158.
|
|
LEI Yun, QIU Yunfeng. Research on parameter response of electronic components based on temperature change[J]. Computer and Digital Engineering, 2015, 43(1):155-158.
|