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中文
In-depth Study on the Contact Fault of Ultra-high Voltage SC Measurement System
QI Baocai, LI Yongbin, MA Shunxu, LI Bin, YU Jinsong, DA Kechao
Journal of Electrical Engineering . 2020, (
4
): 106 -113 . DOI: 10.11985/2020.04.013
