Journal of Electrical Engineering ›› 2023, Vol. 18 ›› Issue (3): 63-72.doi: 10.11985/2023.03.007
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DUO Wenbo1(), LI Hongwei1, LI Shuaibing2(
), YANG Dong1, LU Baopeng2, KANG Yongqiang2, CAO Binglei2
Received:
2023-05-24
Revised:
2023-07-16
Online:
2023-09-25
Published:
2023-10-23
CLC Number:
DUO Wenbo, LI Hongwei, LI Shuaibing, YANG Dong, LU Baopeng, KANG Yongqiang, CAO Binglei. Terahertz Imaging-based Quantitative Characterization of SSA-CNN for Internal Delamination Defects in Layered Composite Insulation Structures[J]. Journal of Electrical Engineering, 2023, 18(3): 63-72.
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