Journal of Electrical Engineering ›› 2018, Vol. 13 ›› Issue (11): 71-78.doi: 10.11985/2018.11.009

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Research on Conduction Characteristics of Double-layered XLPE/EPDM with Different Interface States

Yi Shuhui,Wang Yalin,Wu Jiandong,Yin Yi   

  1. School of Electronic, Information and Electrical Engineering Shanghai Jiao Tong University Shanghai 200240 China
  • Received:2018-08-03 Online:2018-11-30 Published:2020-01-02

Abstract:

In this paper, the conductivity of double-layered XLPE/EPDM with three interface conditions were measured at 30~90℃ and the measuring electric field is from 1kV/mm to 19kV/mm. The influence factors of electric field, interface and temperature on conduction characteristics of double-layered dielectrics were analyzed. The results show that the electric field dependence of the conductivity of the three double-layered dielectrics increases as the electric field increases. The temperature sensitivity of the hot-contact double-layered dielectric conductivity is stronger than that of the other two dielectrics with physical interface, which means the influence of temperature on the conductivity of chemical interface is greater than that of physical interface. Besides, the double-layered dielectric conductivity has a polar effect similar to PN junction and polar effect of the conductivity of hot-contact double-layered dielectric is opposite to that of the other two double-layered dielectrics, which manifests the interface condition largely affects conduction characteristics of double-layered dielectrics.

Key words: Cross-linked polyethylene, Ethylene-propylene-diene monomer, conductivity, temperature, interface

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